CIQTEK Successfully Concludes Participation at Microscopy & Microanalysis 2026

CIQTEK Participates in Microscopy & Microanalysis 2026

August 12, 2026

From August 2 to 6, CIQTEK participated in Microscopy & Microanalysis 2026 (M&M 2026) at the Baird Center in Milwaukee, Wisconsin, USA. At Booth 718, CIQTEK presented its SEM3300 tungsten filament scanning electron microscope and met with conference attendees.

M&M is an annual forum for the science and technology of microscopy and microanalysis. During the event, CIQTEK displayed the SEM3300 tungsten filament SEM at its booth. Through product materials, image displays, and on-site conversations, the team introduced CIQTEK's electron microscopy products and application directions to visitors.

On August 3, CIQTEK delivered a Vendor Tutorial titled:

Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK

The presentation focused on high-speed scanning electron microscopy for large-scale volume microscopy applications. Attendees joined the presentation and exchanged ideas with the CIQTEK team at the booth.

Throughout the conference, the CIQTEK team welcomed visitors and held conversations on electron microscopy products and related applications. We thank the M&M 2026 organizers and everyone who visited the CIQTEK booth. CIQTEK will continue to develop electron microscopy technologies and products for scientific and industrial users.