CIQTEK to Showcase High-Speed SEM Innovation at Microscopy & Microanalysis 2026

July 15, 2026

CIQTEK, a leading global manufacturer of high-end scientific instruments, is pleased to announce its participation in the Microscopy & Microanalysis (M&M) 2026 conference, taking place August 2–6, 2026, at the Baird Center in Milwaukee, Wisconsin, USA.

The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students, and exhibitors in the world. It provides a premier forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.

Event Details

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Date	August 2–6, 2026
Location	Baird Center, Milwaukee, WI
Booth Number	718

Vendor Tutorial: Unlocking the Power of Unique High-Speed SEM

CIQTEK is honored to present a Vendor Tutorial at M&M 2026, featuring our latest breakthrough in scanning electron microscopy technology.

Date: Monday, August 3, 2026
Time: 5:45 PM – 6:45 PM
Title: Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK

This tutorial will demonstrate how CIQTEK's unique high-speed SEM solutions enable researchers to achieve rapid data acquisition while maintaining excellent low-kV imaging resolution — a critical capability for large-scale volume microscopy applications. Traditionally, researchers have had to choose between imaging speed and resolution; CIQTEK has eliminated this trade-off, delivering crystal-clear images at high speeds without compromising sample integrity.

Poster Presentation

CIQTEK is also pleased to share that a research abstract has been accepted for poster presentation at the conference, further demonstrating the company's commitment to advancing the frontiers of microscopy and microanalysis.

What to Expect at Booth 718

At Booth 718, the CIQTEK U.S. team will showcase our tungsten filament SEM and provide:

On-site technical discussions with CIQTEK application specialists and service engineers
Research solution consulting tailored to your specific scientific needs
Live demonstrations of CIQTEK's tungsten filament SEM
Guidance on system selection from routine imaging to advanced large-scale volume microscopy

CIQTEK's electron microscopy portfolio covers a wide range of applications, including tungsten filament SEM, high-resolution FE-SEM, FIB-SEM, and specialized high-speed SEM systems designed for volumetric electron microscopy (VEM) in both materials science and life sciences research.

Connect with CIQTEK in Milwaukee

We invite all attendees to join our Vendor Tutorial on Monday, August 3, at 5:45 PM, and to visit Booth 718 throughout the conference for detailed product information and one-on-one consultations with our technical experts.

For more information about M&M 2026, including registration and the full conference program, please visit the official conference website.

Contact CIQTEK

For meeting requests or inquiries before and during the event, please contact the CIQTEK U.S. team directly: info.usa@ciqtek.com

We look forward to connecting with you in Milwaukee and exploring how CIQTEK's advanced microscopy solutions can accelerate your research.

Neuigkeiten & Veranstaltungen

CIQTEK to Showcase High-Speed SEM Innovation at Microscopy & Microanalysis 2026

Event Details

Vendor Tutorial: Unlocking the Power of Unique High-Speed SEM

Poster Presentation

What to Expect at Booth 718

Connect with CIQTEK in Milwaukee

Contact CIQTEK

Unternehmensnachrichten

Konferenzen und Ausstellungen

Beliebte Produkte

Tisch-EPR-Spektrometer | EPR200M

Wolframfilament-REM | SEM3300

FIB-SEM | DB550

Ultrahochauflösendes FESEM | SEM5000X

X-Band CW-EPR-Spektrometer | EPR300

Kernspinresonanzspektrometer | CAN400